Memory effects in electrochemically gated metallic point contacts

R. Maul,1,2,3 F.-Q. Xie,1,4,5 Ch. Obermair,1,4,5 G. Scho ̈n,1,3,4 Th. Schimmel,1,4,5,a) and W. Wenzel1

ApplPhysLett_100_203511