Sub-15-nm patterning of asymmetric metal electrodes and devices by adhesion lithography

David J. Beesley1,2,*, James Semple1,*, Lethy Krishnan Jagadamma3, Aram Amassian3, Martyn A. McLachlan4, Thomas D. Anthopoulos1 & John C. deMello2

ncomms4933

SAMをテンプレートにするタイプ。