未分類 Charge Trapping States at the SiO2Oligothiophene Monolayer Interface in Field Effect Transistors Studied by Kelvin Probe Force Microscopy by kanrinin • 2013年8月30日 • 0 Comments Yingjie Zhang,†,‡ Dominik Ziegler,§ and Miquel Salmeron† ↑ゲートをかけながらのKFM。 nn403750h What do you think of this post?Awesome (0)
